About: Defect control during femtosecond projection two-photon lithography

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type	Academic Article research paper schema:ScholarlyArticle
isDefinedBy	Covid-on-the-Web dataset
title	Defect control during femtosecond projection two-photon lithography
Creator	Kim, Harnjoo Saha, Sourabh
source	Elsevier
abstract	Abstract Two-photon lithography (TPL) is a photopolymerization-based additive manufacturing technique that enables fabrication of millimeter scale complex three-dimensional (3D) structures with submicron features. Despite this unique capability, TPL has experienced limited industrial adoption due to its low throughput. The recently developed parallel projection technique, called femtosecond projection TPL (FP-TPL), is a promising approach to scale up this process as it increases the throughput up to three orders of magnitude. However, it requires tuning of process parameters, including photopolymer material properties, to minimize over-polymerization-based defects. Here, we show how a modification of the optical projection strategy can be used to control these over-polymerization defects without tuning the photopolymer composition. Through optical modeling of the projection technique, we show that these defects can be minimized by altering the density of the projected mask. In addition, the aspect ratio of the submicron features can by reduced from more than 2 to 1.2. Thus, this optimal projection strategy transforms FP-TPL into a more robust process suitable for high-throughput high-quality 3D printing of micro and nanoscale structures.
has issue date	2020-12-31(xsd:dateTime)
bibo:doi	10.1016/j.promfg.2020.05.157
has license	els-covid
sha1sum (hex)	5c2415bccca5f577c72fdffec5e73fbf57e9d07c
schema:url	https://doi.org/10.1016/j.promfg.2020.05.157
resource representing a document's title	Defect control during femtosecond projection two-photon lithography
schema:publication	Procedia Manufacturing
resource representing a document's body	covid:5c2415bccca5f577c72fdffec5e73fbf57e9d07c#body_text
is schema:about of	named entity 'technique' named entity 'process' named entity 'defects' named entity 'defects' named entity 'ScienceDirect' »more»

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