<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/prov#Entity> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/ns/oa#hasBody>	<http://www.wikidata.org/entity/Q212108> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://schema.org/about>	<http://ns.inria.fr/covid19/32094ea4335fb12c532c995e7751c94a753f8626> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/ns/oa#hasTarget>	<http://ns.inria.fr/covid19/ann/target/fbc308b73833a7b0e5303c59e3cce91e3931cc9f> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://purl.org/dc/terms/subject>	"Engineering" .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/2000/01/rdf-schema#isDefinedBy>	<http://ns.inria.fr/covid19/dataset-1-2> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/2000/01/rdf-schema#label>	"named entity 'Authentication'" .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://purl.org/dc/terms/subject>	"Applied_Science" .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://purl.org/dc/terms/subject>	"Economy" .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/ns/prov#wasGeneratedBy>	<http://ns.inria.fr/covid19/ProvenanceEF> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://purl.org/dc/terms/subject>	"Electronics" .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://www.w3.org/1999/02/22-rdf-syntax-ns#type>	<http://www.w3.org/ns/oa#Annotation> .
<http://ns.inria.fr/covid19/ann/fbc308b73833a7b0e5303c59e3cce91e3931cc9f>	<http://purl.org/dc/terms/creator>	<https://team.inria.fr/wimmics/> .